Kaufman, A. S. <br/><br/>
Intelligent testing with the WISC-R/ 
Alan S. Kaufman 
 - New York  John Wiley & Sons  1979 
 - xix, 268 p.:  ill.;  24 cm. 
<br/><br/> Includes bibliography references and index 
<br/><br/><label>ISBN: </label>0471049719 
<br/><br/><label>LC Class. No.: </label>DUCE BF432.5.W42